> For the complete documentation index, see [llms.txt](https://atomic-data-sciences.gitbook.io/home/llms.txt). Markdown versions of documentation pages are available by appending `.md` to page URLs; this page is available as [Markdown](https://atomic-data-sciences.gitbook.io/home/product-guides/rheed-analysis/examples.md).

# Examples

## [Monitor strain development at interfaces](#monitor-strain-development-at-interfaces)

<figure><img src="/files/Jb5Adr8Y7ikDnYBn98Vd" alt=""><figcaption><p>Detected transition corresponds to a change in deposition source within the heterostructure</p></figcaption></figure>

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## [Develop proxies for ex-situ characterization](#develop-proxies-for-ex-situ-characterization)

Predict properties based on correlations between quantified RHEED patterns and ex-situ characterization

[<mark style="color:blue;">**Example**</mark>](#develop-proxies-for-ex-situ-characterization)<mark style="color:blue;">:</mark> doping concentration from XPS

<figure><img src="/files/fFE3MLkdjuDrI7swacCO" alt=""><figcaption><p>Intensity maxima position observed to correlates with doping</p></figcaption></figure>

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## [Engineering film surfaces](#engineering-film-surfaces)

Automatically detected changes in RHEED videos can be used to understand the relationship between process controls and surface characteristics. Source shuttering or various annealing steps can be correlated with metrics extracted from RHEED pattern features to develop better control over surface termination.&#x20;

There are a number of examples in the [literature ](https://atomic-data-sciences.gitbook.io/product-docs/literature/rheed-analysis#clustering)demonstrate using the foundational clustering techniques employed in Atomscale to engineering surfaces.